Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

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Main Authors: Liu, X., Chan, D.S.H., Phang, J.C.H., Chim, W.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81385
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-813852024-11-14T10:20:43Z Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures Liu, X. Chan, D.S.H. Phang, J.C.H. Chim, W.K. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 270-274 234 2014-10-07T03:07:45Z 2014-10-07T03:07:45Z 1997 Conference Paper Liu, X.,Chan, D.S.H.,Phang, J.C.H.,Chim, W.K. (1997). Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 270-274. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81385 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Liu, X.
Chan, D.S.H.
Phang, J.C.H.
Chim, W.K.
format Conference or Workshop Item
author Liu, X.
Chan, D.S.H.
Phang, J.C.H.
Chim, W.K.
spellingShingle Liu, X.
Chan, D.S.H.
Phang, J.C.H.
Chim, W.K.
Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures
author_sort Liu, X.
title Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures
title_short Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures
title_full Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures
title_fullStr Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures
title_full_unstemmed Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structures
title_sort cathodoluminescence evaluation of electrical stress condition of si-sio2 structures
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/81385
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