Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's
Proceedings of the International Conference on Microelectronics
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sg-nus-scholar.10635-813942015-01-08T00:36:56Z Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's Goh, Y.H. Ah, L.K. Ling, C.H. ELECTRICAL ENGINEERING Proceedings of the International Conference on Microelectronics 2 659-662 234 2014-10-07T03:07:51Z 2014-10-07T03:07:51Z 1997 Conference Paper Goh, Y.H.,Ah, L.K.,Ling, C.H. (1997). Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's. Proceedings of the International Conference on Microelectronics 2 : 659-662. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81394 NOT_IN_WOS Scopus |
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Proceedings of the International Conference on Microelectronics |
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ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Goh, Y.H. Ah, L.K. Ling, C.H. |
| format |
Conference or Workshop Item |
| author |
Goh, Y.H. Ah, L.K. Ling, C.H. |
| spellingShingle |
Goh, Y.H. Ah, L.K. Ling, C.H. Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's |
| author_sort |
Goh, Y.H. |
| title |
Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's |
| title_short |
Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's |
| title_full |
Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's |
| title_fullStr |
Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's |
| title_full_unstemmed |
Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's |
| title_sort |
correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-mosfet's |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81394 |
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1681089063247937536 |