Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-814042015-02-24T09:37:28Z Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device Lou, C.L. Tan, C.B. Chim, W.K. Chan, D.S.H. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 140-145 234 2014-10-07T03:07:57Z 2014-10-07T03:07:57Z 1997 Conference Paper Lou, C.L.,Tan, C.B.,Chim, W.K.,Chan, D.S.H. (1997). Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 140-145. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81404 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Lou, C.L. Tan, C.B. Chim, W.K. Chan, D.S.H. |
| format |
Conference or Workshop Item |
| author |
Lou, C.L. Tan, C.B. Chim, W.K. Chan, D.S.H. |
| spellingShingle |
Lou, C.L. Tan, C.B. Chim, W.K. Chan, D.S.H. Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device |
| author_sort |
Lou, C.L. |
| title |
Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device |
| title_short |
Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device |
| title_full |
Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device |
| title_fullStr |
Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device |
| title_full_unstemmed |
Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device |
| title_sort |
effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction mosfets using a single device |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81404 |
| _version_ |
1681089065136422912 |