Energy dependence of interface trap density - investigated by the DCIV method
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
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sg-nus-scholar.10635-814102015-02-09T10:29:27Z Energy dependence of interface trap density - investigated by the DCIV method Jie, B.B. Li, M.F. Lo, K.F. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 206-209 234 2014-10-07T03:08:01Z 2014-10-07T03:08:01Z 1999 Conference Paper Jie, B.B.,Li, M.F.,Lo, K.F. (1999). Energy dependence of interface trap density - investigated by the DCIV method. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 206-209. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81410 NOT_IN_WOS Scopus |
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Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Jie, B.B. Li, M.F. Lo, K.F. |
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Conference or Workshop Item |
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Jie, B.B. Li, M.F. Lo, K.F. |
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Jie, B.B. Li, M.F. Lo, K.F. Energy dependence of interface trap density - investigated by the DCIV method |
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Jie, B.B. |
title |
Energy dependence of interface trap density - investigated by the DCIV method |
title_short |
Energy dependence of interface trap density - investigated by the DCIV method |
title_full |
Energy dependence of interface trap density - investigated by the DCIV method |
title_fullStr |
Energy dependence of interface trap density - investigated by the DCIV method |
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Energy dependence of interface trap density - investigated by the DCIV method |
title_sort |
energy dependence of interface trap density - investigated by the dciv method |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/81410 |
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