Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors

Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors

Conference Record - IEEE Instrumentation and Measurement Technology Conference

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Bibliographic Details
Main Authors: Yeo, S.P., Ang, C.K., Cheng, M.
Other Authors: CENTRE FOR COMPUTATIONAL MECHANICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81478
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Institution: National University of Singapore
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Summary:Conference Record - IEEE Instrumentation and Measurement Technology Conference

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