Investigation of quasi-breakdown mechanism in ultra-thin gate oxides

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Guan, H., He, Y.D., Li, M.F., Cho, B.J., Dong, Z.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81499
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Institution: National University of Singapore
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