Optical and x-ray diffraction characterization of MBE-grown InGaAs, InAIAs and InGaAIAs on InP

Optical and x-ray diffraction characterization of MBE-grown InGaAs, InAIAs and InGaAIAs on InP

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Feng, Z.C., Chua, S.J., Raman, A., Lim, N.N.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81642
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Institution: National University of Singapore
Description
Summary:Materials Research Society Symposium - Proceedings

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