Optical and x-ray diffraction characterization of MBE-grown InGaAs, InAIAs and InGaAIAs on InP
Materials Research Society Symposium - Proceedings
Saved in:
Main Authors: | Feng, Z.C., Chua, S.J., Raman, A., Lim, N.N. |
---|---|
Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81642 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Investigation of dislocations and traps in MBE grown p-InGaAs/GaAs heterostructures
by: Du, A.Y., et al.
Published: (2014) -
Investigation of dislocations and traps in MBE grown p-InGaAs/GaAs heterostructures
by: Du, A.Y., et al.
Published: (2014) -
Noncontact thickness and composition assessment of a strained AIGaAs/AIAs/InGaAs double barrier multiple quantum well structure
by: V. W.L. Chin, et al.
Published: (2018) -
Dislocations and traps in MBE grown lattice mismatched p-InGaAs/GaAs layers on GaAs substrates
by: Du, A.Y., et al.
Published: (2014) -
Deep level states caused by dislocations in MBE grown p-InGaAs/GaAs heterostructures
by: Du, A.Y., et al.
Published: (2014)