Metallurgical stability of ohmic contacts on thin base InP/InGaAs/InP HBT's

10.1109/55.484124

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Bibliographic Details
Main Authors: Chor, E.F., Malik, R.J., Hamm, R.A., Ryan, R.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80711
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Institution: National University of Singapore