Metallurgical stability of ohmic contacts on thin base InP/InGaAs/InP HBT's
10.1109/55.484124
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Main Authors: | Chor, E.F., Malik, R.J., Hamm, R.A., Ryan, R. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80711 |
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Institution: | National University of Singapore |
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