Optical and x-ray diffraction characterization of MBE-grown InGaAs, InAIAs and InGaAIAs on InP

• Main Authors: Feng, Z.C., Chua, S.J., Raman, A., Lim, N.N.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/81642
• Institution: National University of Singapore

Materials Research Society Symposium - Proceedings