Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films

Journal of Applied Physics

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Main Authors: Choi, W.K., Choo, C.K., Lu, Y.F.
Other Authors: ELECTRICAL ENGINEERING
Format: Review
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81817
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Institution: National University of Singapore
id sg-nus-scholar.10635-81817
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spelling sg-nus-scholar.10635-818172024-11-10T16:37:13Z Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films Choi, W.K. Choo, C.K. Lu, Y.F. ELECTRICAL ENGINEERING Journal of Applied Physics 80 10 5837-5842 JAPIA 2014-10-07T03:12:21Z 2014-10-07T03:12:21Z 1996-11-15 Review Choi, W.K.,Choo, C.K.,Lu, Y.F. (1996-11-15). Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films. Journal of Applied Physics 80 (10) : 5837-5842. ScholarBank@NUS Repository. 00218979 http://scholarbank.nus.edu.sg/handle/10635/81817 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Journal of Applied Physics
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Choi, W.K.
Choo, C.K.
Lu, Y.F.
format Review
author Choi, W.K.
Choo, C.K.
Lu, Y.F.
spellingShingle Choi, W.K.
Choo, C.K.
Lu, Y.F.
Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
author_sort Choi, W.K.
title Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
title_short Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
title_full Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
title_fullStr Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
title_full_unstemmed Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
title_sort electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide films
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/81817
_version_ 1821220156695642112