Band alignment study of lattice-matched InAlP and Ge using x-ray photoelectron spectroscopy

Band alignment study of lattice-matched InAlP and Ge using x-ray photoelectron spectroscopy

10.1063/1.4813882

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Bibliographic Details
Main Authors: Owen, M.H.S., Guo, C., Chen, S.-H., Wan, C.-T., Cheng, C.-C., Wu, C.-H., Ko, C.-H., Wann, C.H., Ivana, Zhang, Z., Pan, J.S., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82001
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/82001

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