Photoelectron spectroscopy study of band alignment at interface between Ni-InGaAs and In0.53Ga0.47As

Photoelectron spectroscopy study of band alignment at interface between Ni-InGaAs and In0.53Ga0.47As

10.1063/1.3607959

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Bibliographic Details
Main Authors: Ivana, Pan, J., Zhang, Z., Zhang, X., Guo, H., Gong, X., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82896
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/82896

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