Conductance-voltage measurements on germanium nanocrystal memory structures and effect of gate electric field coupling

10.1063/1.2186738

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Bibliographic Details
Main Authors: Ng, T.H., Chim, W.K., Choi, W.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82079
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Institution: National University of Singapore