Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition

10.1016/j.apsusc.2006.05.060

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Bibliographic Details
Main Authors: Chen, X.Y., Lu, Y.F., Wu, Y.H., Cho, B.J., Tang, L.J., Lu, D., Dong, J.R.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/82101
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-821012023-10-29T23:36:18Z Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition Chen, X.Y. Lu, Y.F. Wu, Y.H. Cho, B.J. Tang, L.J. Lu, D. Dong, J.R. ELECTRICAL & COMPUTER ENGINEERING Optical properties Plasma-enhanced chemical vapor deposition Silicon nanocrystals Silicon oxide 10.1016/j.apsusc.2006.05.060 Applied Surface Science 253 5 2718-2726 ASUSE 2014-10-07T04:25:24Z 2014-10-07T04:25:24Z 2006-12-30 Article Chen, X.Y., Lu, Y.F., Wu, Y.H., Cho, B.J., Tang, L.J., Lu, D., Dong, J.R. (2006-12-30). Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition. Applied Surface Science 253 (5) : 2718-2726. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2006.05.060 01694332 http://scholarbank.nus.edu.sg/handle/10635/82101 000243244300059 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Optical properties
Plasma-enhanced chemical vapor deposition
Silicon nanocrystals
Silicon oxide
spellingShingle Optical properties
Plasma-enhanced chemical vapor deposition
Silicon nanocrystals
Silicon oxide
Chen, X.Y.
Lu, Y.F.
Wu, Y.H.
Cho, B.J.
Tang, L.J.
Lu, D.
Dong, J.R.
Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition
description 10.1016/j.apsusc.2006.05.060
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Chen, X.Y.
Lu, Y.F.
Wu, Y.H.
Cho, B.J.
Tang, L.J.
Lu, D.
Dong, J.R.
format Article
author Chen, X.Y.
Lu, Y.F.
Wu, Y.H.
Cho, B.J.
Tang, L.J.
Lu, D.
Dong, J.R.
author_sort Chen, X.Y.
title Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition
title_short Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition
title_full Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition
title_fullStr Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition
title_full_unstemmed Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition
title_sort correlation between optical properties and si nanocrystal formation of si-rich si oxide films prepared by plasma-enhanced chemical vapor deposition
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82101
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