Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors

10.1063/1.1788888

Saved in:

Bibliographic Details
Main Authors:	Low, T., Li, M.F., Shen, C., Yeo, Y.-C., Hou, Y.T., Zhu, C., Chin, A., Kwong, D.L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82262
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-82262
record_format	dspace
spelling	sg-nus-scholar.10635-822622023-10-25T23:02:08Z Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors Low, T. Li, M.F. Shen, C. Yeo, Y.-C. Hou, Y.T. Zhu, C. Chin, A. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1788888 Applied Physics Letters 85 12 2402-2404 APPLA 2014-10-07T04:27:17Z 2014-10-07T04:27:17Z 2004-09-20 Article Low, T., Li, M.F., Shen, C., Yeo, Y.-C., Hou, Y.T., Zhu, C., Chin, A., Kwong, D.L. (2004-09-20). Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors. Applied Physics Letters 85 (12) : 2402-2404. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1788888 00036951 http://scholarbank.nus.edu.sg/handle/10635/82262 000224145300083 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1788888
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Low, T. Li, M.F. Shen, C. Yeo, Y.-C. Hou, Y.T. Zhu, C. Chin, A. Kwong, D.L.
format	Article
author	Low, T. Li, M.F. Shen, C. Yeo, Y.-C. Hou, Y.T. Zhu, C. Chin, A. Kwong, D.L.
spellingShingle	Low, T. Li, M.F. Shen, C. Yeo, Y.-C. Hou, Y.T. Zhu, C. Chin, A. Kwong, D.L. Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors
author_sort	Low, T.
title	Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors
title_short	Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors
title_full	Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors
title_fullStr	Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors
title_full_unstemmed	Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors
title_sort	electron mobility in ge and strained-si channel ultrathin-body metal-oxide semi conductor field-effect transistors
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82262
_version_	1781784094120607744

Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors

Similar Items