Fabrication and characterization of bit-patterned media beyond 1.5 Tbit/in2

Fabrication and characterization of bit-patterned media beyond 1.5 Tbit/in2

10.1088/0957-4484/22/38/385301

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Bibliographic Details
Main Authors: Yang, J.K.W., Chen, Y., Huang, T., Duan, H., Thiyagarajah, N., Hui, H.K., Leong, S.H., Ng, V.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82331
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/82331

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