Fabrication and characterization of bit-patterned media beyond 1.5 Tbit/in2

10.1088/0957-4484/22/38/385301

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Bibliographic Details
Main Authors:	Yang, J.K.W., Chen, Y., Huang, T., Duan, H., Thiyagarajah, N., Hui, H.K., Leong, S.H., Ng, V.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82331
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Institution:	National University of Singapore

Description
Summary:	10.1088/0957-4484/22/38/385301

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