Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (

10.1063/1.1425438

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Main Authors:	Chim, W.K., Lim, P.S.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82474
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82474
record_format	dspace
spelling	sg-nus-scholar.10635-824742023-10-25T22:06:13Z Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin ( Chim, W.K. Lim, P.S. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1425438 Journal of Applied Physics 91 3 1304-1313 JAPIA 2014-10-07T04:29:50Z 2014-10-07T04:29:50Z 2002-02-01 Article Chim, W.K., Lim, P.S. (2002-02-01). Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (. Journal of Applied Physics 91 (3) : 1304-1313. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1425438 00218979 http://scholarbank.nus.edu.sg/handle/10635/82474 000173418500062 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1425438
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Chim, W.K. Lim, P.S.
format	Article
author	Chim, W.K. Lim, P.S.
spellingShingle	Chim, W.K. Lim, P.S. Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
author_sort	Chim, W.K.
title	Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
title_short	Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
title_full	Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
title_fullStr	Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
title_full_unstemmed	Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
title_sort	hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82474
_version_	1781784146743394304

Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (

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