Identification of deep levels in GaN associated with dislocations

Identification of deep levels in GaN associated with dislocations

10.1088/0953-8984/16/34/027

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Bibliographic Details
Main Authors: Soh, C.B., Chua, S.J., Lim, H.F., Chi, D.Z., Liu, W., Tripathy, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82489
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Institution: National University of Singapore
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Summary:10.1088/0953-8984/16/34/027

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