Identification of deep levels in GaN associated with dislocations

Identification of deep levels in GaN associated with dislocations

10.1088/0953-8984/16/34/027

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Bibliographic Details
Main Authors:	Soh, C.B., Chua, S.J., Lim, H.F., Chi, D.Z., Liu, W., Tripathy, S.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82489
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Institution:	National University of Singapore

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