Correlation of a generation-recombination center with a deep level trap in GaN

10.1063/1.4914393

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Bibliographic Details
Main Authors: Nguyen, Xuan Sang, Lin, Ke, Fitzgerald, Eugene A., Chua, Soojin
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: American Institute of Physics Inc. 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/127200
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Institution: National University of Singapore