Correlation of a generation-recombination center with a deep level trap in GaN

Correlation of a generation-recombination center with a deep level trap in GaN

10.1063/1.4914393

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Bibliographic Details
Main Authors:	Nguyen, Xuan Sang, Lin, Ke, Fitzgerald, Eugene A., Chua, Soojin
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	American Institute of Physics Inc. 2016
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/127200
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Institution:	National University of Singapore

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