Correlation of a generation-recombination center with a deep level trap in GaN

• Main Authors: Nguyen, Xuan Sang, Lin, Ke, Fitzgerald, Eugene A., Chua, Soojin
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: American Institute of Physics Inc. 2016
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/127200
• Institution: National University of Singapore

10.1063/1.4914393