Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation

10.1109/LED.2005.845501

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Bibliographic Details
Main Authors:	Tan, C.F., Chor, E.F., Lee, H., Liu, J., Quek, E., Chan, L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Carbon Junction leakage Solid-phase epitaxy re-growth (SPER)
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82616
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82616
record_format	dspace
spelling	sg-nus-scholar.10635-826162015-01-08T02:38:11Z Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation Tan, C.F. Chor, E.F. Lee, H. Liu, J. Quek, E. Chan, L. ELECTRICAL & COMPUTER ENGINEERING Carbon Junction leakage Solid-phase epitaxy re-growth (SPER) 10.1109/LED.2005.845501 IEEE Electron Device Letters 26 4 252-254 EDLED 2014-10-07T04:31:29Z 2014-10-07T04:31:29Z 2005-04 Article Tan, C.F.,Chor, E.F.,Lee, H.,Liu, J.,Quek, E.,Chan, L. (2005-04). Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation. IEEE Electron Device Letters 26 (4) : 252-254. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/LED.2005.845501" target="_blank">https://doi.org/10.1109/LED.2005.845501</a> 07413106 http://scholarbank.nus.edu.sg/handle/10635/82616 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Carbon Junction leakage Solid-phase epitaxy re-growth (SPER)
spellingShingle	Carbon Junction leakage Solid-phase epitaxy re-growth (SPER) Tan, C.F. Chor, E.F. Lee, H. Liu, J. Quek, E. Chan, L. Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation
description	10.1109/LED.2005.845501
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Tan, C.F. Chor, E.F. Lee, H. Liu, J. Quek, E. Chan, L.
format	Article
author	Tan, C.F. Chor, E.F. Lee, H. Liu, J. Quek, E. Chan, L.
author_sort	Tan, C.F.
title	Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation
title_short	Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation
title_full	Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation
title_fullStr	Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation
title_full_unstemmed	Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation
title_sort	leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon si1-ycy incorporation
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82616
_version_	1681089284960944128

Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation

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