Micro-Raman investigation of strain in GaN and Al xGa 1-xN/GaN heterostructures grown on Si(111)

Micro-Raman investigation of strain in GaN and Al xGa 1-xN/GaN heterostructures grown on Si(111)

10.1063/1.1502921

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Bibliographic Details
Main Authors: Tripathy, S., Chua, S.J., Chen, P., Miao, Z.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82697
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Institution: National University of Singapore
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Summary:10.1063/1.1502921

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