Relaxed and strained patterned germanium-tin structures: A Raman scattering study

10.1149/2.013304jss

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Bibliographic Details
Main Authors:	Cheng, R., Wang, W., Gong, X., Sun, L., Guo, P., Hu, H., Shen, Z., Han, G., Yeo, Y.-C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82973
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Institution:	National University of Singapore

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Summary:	10.1149/2.013304jss

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