Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs
10.1149/1.3090178
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sg-nus-scholar.10635-830212024-11-09T07:32:25Z Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs Koh, S.-M. Wang, X. Sekar, K. Krull, W. Samudra, G.S. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1149/1.3090178 Journal of the Electrochemical Society 156 5 H361-H366 JESOA 2014-10-07T04:36:18Z 2014-10-07T04:36:18Z 2009 Article Koh, S.-M., Wang, X., Sekar, K., Krull, W., Samudra, G.S., Yeo, Y.-C. (2009). Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs. Journal of the Electrochemical Society 156 (5) : H361-H366. ScholarBank@NUS Repository. https://doi.org/10.1149/1.3090178 00134651 http://scholarbank.nus.edu.sg/handle/10635/83021 000264780400056 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Koh, S.-M. Wang, X. Sekar, K. Krull, W. Samudra, G.S. Yeo, Y.-C. |
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Koh, S.-M. Wang, X. Sekar, K. Krull, W. Samudra, G.S. Yeo, Y.-C. |
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Koh, S.-M. Wang, X. Sekar, K. Krull, W. Samudra, G.S. Yeo, Y.-C. Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs |
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Koh, S.-M. |
title |
Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs |
title_short |
Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs |
title_full |
Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs |
title_fullStr |
Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs |
title_full_unstemmed |
Silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel MOSFETs |
title_sort |
silicon-carbon formed using cluster-carbon implant and laser-induced epitaxy for application as source/drain stressors in strained n-channel mosfets |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/83021 |
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