A robust and accurate drain current I-V model for MESFET

Asia-Pacific Microwave Conference Proceedings, APMC

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Bibliographic Details
Main Authors: Ooi, B.L., Ma, J.Y., Leong, M.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83418
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Institution: National University of Singapore
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