A robust and accurate drain current I-V model for MESFET
Asia-Pacific Microwave Conference Proceedings, APMC
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Main Authors: | Ooi, B.L., Ma, J.Y., Leong, M.S. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83418 |
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Institution: | National University of Singapore |
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