Band offset measurements of the pulsed-laser-deposition-grown Sc 2O3 (111)/GaN (0001) heterostructure by X-ray photoelectron spectroscopy

10.1002/pssc.200674702

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Bibliographic Details
Main Authors: Liu, C., Chor, E.F., Tan, L.S., Dong, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83509
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Institution: National University of Singapore