Band offset measurements of the pulsed-laser-deposition-grown Sc 2O3 (111)/GaN (0001) heterostructure by X-ray photoelectron spectroscopy
10.1002/pssc.200674702
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Main Authors: | Liu, C., Chor, E.F., Tan, L.S., Dong, Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83509 |
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Institution: | National University of Singapore |
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