Carbon- and tin- Incorporated source/drain stressors for CMOS transistors
10.1149/1.2986751
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2014
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sg-nus-scholar.10635-835272024-11-08T16:45:23Z Carbon- and tin- Incorporated source/drain stressors for CMOS transistors Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1149/1.2986751 ECS Transactions 16 10 39-46 2014-10-07T04:42:13Z 2014-10-07T04:42:13Z 2008 Conference Paper Yeo, Y.-C. (2008). Carbon- and tin- Incorporated source/drain stressors for CMOS transistors. ECS Transactions 16 (10) : 39-46. ScholarBank@NUS Repository. https://doi.org/10.1149/1.2986751 9781566776561 19385862 http://scholarbank.nus.edu.sg/handle/10635/83527 000273336700004 Scopus |
| institution |
National University of Singapore |
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NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1149/1.2986751 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Yeo, Y.-C. |
| format |
Conference or Workshop Item |
| author |
Yeo, Y.-C. |
| spellingShingle |
Yeo, Y.-C. Carbon- and tin- Incorporated source/drain stressors for CMOS transistors |
| author_sort |
Yeo, Y.-C. |
| title |
Carbon- and tin- Incorporated source/drain stressors for CMOS transistors |
| title_short |
Carbon- and tin- Incorporated source/drain stressors for CMOS transistors |
| title_full |
Carbon- and tin- Incorporated source/drain stressors for CMOS transistors |
| title_fullStr |
Carbon- and tin- Incorporated source/drain stressors for CMOS transistors |
| title_full_unstemmed |
Carbon- and tin- Incorporated source/drain stressors for CMOS transistors |
| title_sort |
carbon- and tin- incorporated source/drain stressors for cmos transistors |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/83527 |
| _version_ |
1821199483312013312 |