Investigation on the antiferromagnetic component in the intrinsic exchange bias in structurally single phase Cr 2Te 3 thin film

10.1063/1.3677883

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Bibliographic Details
Main Authors: Hui, L., Lim, S.T., Bi, J.F., Teo, K.L.
Other Authors: DATA STORAGE INSTITUTE
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83866
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Institution: National University of Singapore