Investigation on the antiferromagnetic component in the intrinsic exchange bias in structurally single phase Cr 2Te 3 thin film
10.1063/1.3677883
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Main Authors: | Hui, L., Lim, S.T., Bi, J.F., Teo, K.L. |
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Other Authors: | DATA STORAGE INSTITUTE |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83866 |
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Institution: | National University of Singapore |
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