Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

10.1109/IPFA.2008.4588178

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Bibliographic Details
Main Authors:	Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84002
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-84002
record_format	dspace
spelling	sg-nus-scholar.10635-840022015-01-08T00:30:48Z Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs Tan, S.L. Teo, J.K.J. Toh, K.H. Isakov, D. Chan, D.S.H. Koh, L.S. Chua, C.M. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IPFA.2008.4588178 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA - 2014-10-07T04:47:40Z 2014-10-07T04:47:40Z 2008 Conference Paper Tan, S.L.,Teo, J.K.J.,Toh, K.H.,Isakov, D.,Chan, D.S.H.,Koh, L.S.,Chua, C.M.,Phang, J.C.H. (2008). Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2008.4588178" target="_blank">https://doi.org/10.1109/IPFA.2008.4588178</a> 1424420393 http://scholarbank.nus.edu.sg/handle/10635/84002 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	10.1109/IPFA.2008.4588178
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Tan, S.L. Teo, J.K.J. Toh, K.H. Isakov, D. Chan, D.S.H. Koh, L.S. Chua, C.M. Phang, J.C.H.
format	Conference or Workshop Item
author	Tan, S.L. Teo, J.K.J. Toh, K.H. Isakov, D. Chan, D.S.H. Koh, L.S. Chua, C.M. Phang, J.C.H.
spellingShingle	Tan, S.L. Teo, J.K.J. Toh, K.H. Isakov, D. Chan, D.S.H. Koh, L.S. Chua, C.M. Phang, J.C.H. Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
author_sort	Tan, S.L.
title	Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_short	Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_full	Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_fullStr	Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_full_unstemmed	Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_sort	near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nmosfets and pmosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84002
_version_	1681089539252158464

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

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