Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs

• Main Authors: Tan, S.L., Ang, K.W., Toh, K.H., Isakov, D., Chua, C.M., Koh, L.S., Yeo, Y.C., Chan, D.S.H., Phang, J.C.H.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Conference or Workshop Item
• 出版: 2014
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/71105
• 機構: National University of Singapore

Conference Proceedings from the International Symposium for Testing and Failure Analysis