Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs

Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors: Tan, S.L., Ang, K.W., Toh, K.H., Isakov, D., Chua, C.M., Koh, L.S., Yeo, Y.C., Chan, D.S.H., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71105
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/71105

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