Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors:	Tan, S.L., Ang, K.W., Toh, K.H., Isakov, D., Chua, C.M., Koh, L.S., Yeo, Y.C., Chan, D.S.H., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71105
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-71105
record_format	dspace
spelling	sg-nus-scholar.10635-711052015-01-28T17:16:14Z Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs Tan, S.L. Ang, K.W. Toh, K.H. Isakov, D. Chua, C.M. Koh, L.S. Yeo, Y.C. Chan, D.S.H. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 81-85 2014-06-19T03:19:54Z 2014-06-19T03:19:54Z 2007 Conference Paper Tan, S.L.,Ang, K.W.,Toh, K.H.,Isakov, D.,Chua, C.M.,Koh, L.S.,Yeo, Y.C.,Chan, D.S.H.,Phang, J.C.H. (2007). Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 81-85. ScholarBank@NUS Repository. 0871708639 http://scholarbank.nus.edu.sg/handle/10635/71105 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Conference Proceedings from the International Symposium for Testing and Failure Analysis
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Tan, S.L. Ang, K.W. Toh, K.H. Isakov, D. Chua, C.M. Koh, L.S. Yeo, Y.C. Chan, D.S.H. Phang, J.C.H.
format	Conference or Workshop Item
author	Tan, S.L. Ang, K.W. Toh, K.H. Isakov, D. Chua, C.M. Koh, L.S. Yeo, Y.C. Chan, D.S.H. Phang, J.C.H.
spellingShingle	Tan, S.L. Ang, K.W. Toh, K.H. Isakov, D. Chua, C.M. Koh, L.S. Yeo, Y.C. Chan, D.S.H. Phang, J.C.H. Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
author_sort	Tan, S.L.
title	Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
title_short	Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
title_full	Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
title_fullStr	Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
title_full_unstemmed	Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
title_sort	near-ir photon emission spectroscopy on strained and unstrained 60 nm silicon nmosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/71105
_version_	1681087322905378816

Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs

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