New insights of BTI degradation in MOSFETs with SiON gate dielectrics

10.1149/1.3122098

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Bibliographic Details
Main Authors:	Li, M.-F., Huang, D., Liu, W.J., Liu, Z.Y., Huang, X.Y.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84008
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-84008
record_format	dspace
spelling	sg-nus-scholar.10635-840082023-10-26T09:37:29Z New insights of BTI degradation in MOSFETs with SiON gate dielectrics Li, M.-F. Huang, D. Liu, W.J. Liu, Z.Y. Huang, X.Y. ELECTRICAL & COMPUTER ENGINEERING 10.1149/1.3122098 ECS Transactions 19 2 301-318 2014-10-07T04:47:44Z 2014-10-07T04:47:44Z 2009 Conference Paper Li, M.-F., Huang, D., Liu, W.J., Liu, Z.Y., Huang, X.Y. (2009). New insights of BTI degradation in MOSFETs with SiON gate dielectrics. ECS Transactions 19 (2) : 301-318. ScholarBank@NUS Repository. https://doi.org/10.1149/1.3122098 9781566777100 19385862 http://scholarbank.nus.edu.sg/handle/10635/84008 000273338000016 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1149/1.3122098
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Li, M.-F. Huang, D. Liu, W.J. Liu, Z.Y. Huang, X.Y.
format	Conference or Workshop Item
author	Li, M.-F. Huang, D. Liu, W.J. Liu, Z.Y. Huang, X.Y.
spellingShingle	Li, M.-F. Huang, D. Liu, W.J. Liu, Z.Y. Huang, X.Y. New insights of BTI degradation in MOSFETs with SiON gate dielectrics
author_sort	Li, M.-F.
title	New insights of BTI degradation in MOSFETs with SiON gate dielectrics
title_short	New insights of BTI degradation in MOSFETs with SiON gate dielectrics
title_full	New insights of BTI degradation in MOSFETs with SiON gate dielectrics
title_fullStr	New insights of BTI degradation in MOSFETs with SiON gate dielectrics
title_full_unstemmed	New insights of BTI degradation in MOSFETs with SiON gate dielectrics
title_sort	new insights of bti degradation in mosfets with sion gate dielectrics
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84008
_version_	1781784413263101952

New insights of BTI degradation in MOSFETs with SiON gate dielectrics

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