On-the-fly interface trap measurement and its impact on the understanding of NBTI mechanism for p-MOSFETs with SiON gate dielectric
10.1109/IEDM.2007.4419072
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Main Authors: | , , , , , , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/84043 |
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Institution: | National University of Singapore |