Low Vt gate-first Al/TaN/[Ir3Si-HfSi 2-x]/HfLaON CMOS using simple laser annealing/reflection

by Liao, C.C., Chin, A., Su, N.C., Li, M.-F., Wang, S.J.
Published 2014

The effect of IrO2-IrO2- Hf-LaAlO3 gate dielectric on the bias-temperature instability of 3-D GOI CMOSFETs

by Yu, D.S., Liao, C.C., Cheng, C.F., Chin, A., Li, M.F., McAlister, S.P.
Published 2014

High performance metal-gate/high-κ MOSFETs and GaAs compatible RF passive devices on Ge-on-insulator technology

by Chin, A., Kao, H.L., Yu, D.S., Liao, C.C., Zhu, C., Li, M.-F., Zhu, S., Kwong, D.-L.
Published 2014

Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering

by Chin, A., Lin, S.H., Yang, H.J., Tsai, C.Y., Yeh, F.S., Liao, C.C., Li, M.-F.
Published 2014

Very high κ and high density TiTaO MIM capacitors for analog and RF applications

by Chiang, K.C., Chin, A., Lai, C.H., Chen, W.J., Cheng, C.F., Hung, B.F., Liao, C.C.
Published 2014

A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs

by Huang, D., Liu, W.J., Liu, Z.Y., Liao, C.C., Zhang, L.-F., Gan, Z., Wong, W., Li, M.-F.
Published 2014

The last and next decades of the asian core program on cutting-edge organic chemistry in asia

by Isobe, M., Nishida, A., Choo, Y.-M., Rahman, N.A., Ploypradith, P., Ruchirawat, S., Lin, G.-Q., Li, A., Yao, Z.-J., Uang, B.-J., Liao, C.-C., Chiu, P., Kim, B.M., Loh, T.P.
Published 2017

Studies of NBTI in pMOSFETs with thermal and plasma nitrided SiON gate oxides by OFIT and FPM methods

by Liu, W.J., Huang, D., Sun, Q.Q., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Li, M.-F.
Published 2014

Comprehensive studies of BTI effects in CMOSFETs with SiON by new measurement techniques

by Liu, Z.Y., Huang, D., Liu, W.J., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Li, M.-F.
Published 2014

Three-dimensional metal gate-high-Κ-GOI CMOSFETs on 1-poly-6-metal 0.18-μm Si devices

by Yu, D.S., Chin, A., Liao, C.C., Lee, C.F., Cheng, C.F., Li, M.F., Yoo, W.J., McAlister, S.P.
Published 2014

On-the-fly interface trap measurement and its impact on the understanding of NBTI mechanism for p-MOSFETs with SiON gate dielectric

by Liu, W.J., Liu, Z.Y., Huang, D., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Shen, C., Li, M.-F.
Published 2014

Flat band voltage control on low Vt metal-gate/high-κ CMOSFETs with small EOT (Invited Paper)

by Chin, A., Chang, M.F., Lin, S.H., Chen, W.B., Lee, P.T., Yeh, F.S., Liao, C.C., Li, M.-F., Su, N.C., Wang, S.J.
Published 2014

Characteristics of NBTI in pMOSFETs with thermally and plasma nitrided gate oxides

by Liu, W.J., Liu, Z.Y., Luo, Y., Jiao, G.F., Huang, X.Y., Huang, D., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Li, M.-F.
Published 2014

Author Correction: Diversity in gut bacterial community of school-age children in Asia (Scientific Reports, (2015), 5, 1, (8397), 10.1038/srep08397)

by Nakayama, J., Watanabe, K., Jiang, J., Matsuda, K., Chao, S.-H., Haryono, P., La-ongkham, O., Sarwoko, M.-A., Sujaya, I.N., Zhao, L., Chen, K.-T., Chen, Y.-P., Chiu, H.-H., Hidaka, T., Huang, N.-X., Kiyohara, C., Kurakawa, T., Sakamoto, N., Sonomoto, K., Tashiro, K., Tsuji, H., Chen, M.-J., Leelavatcharamas, V., Liao, C.-C., Nitisinprasert, S., Rahayu, E.S., Ren, F.-Z., Tsai, Y.-C., Lee, Y.-K.
Published 2021