Low Vt gate-first Al/TaN/[Ir3Si-HfSi 2-x]/HfLaON CMOS using simple laser annealing/reflection

10.1109/VLSIT.2008.4588614

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Bibliographic Details
Main Authors: Liao, C.C., Chin, A., Su, N.C., Li, M.-F., Wang, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83909
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Institution: National University of Singapore