Robustness-driven energy-efficient ultra-low voltage standard cell design with intra-cell mixed-Vt methodology

Robustness-driven energy-efficient ultra-low voltage standard cell design with intra-cell mixed-Vt methodology

10.1109/ISLPED.2013.6629317

Saved in:
Bibliographic Details
Main Authors: Zhao, W., Ha, Y., Hoo, C.H., Alvarez, A.B.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Intra-cell mixed-Vt
multi-Vt design
standard cell library
subthreshold circuits
yield enhancement
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84149
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/84149

Similar Items