Robustness-driven energy-efficient ultra-low voltage standard cell design with intra-cell mixed-Vt methodology

• Main Authors: Zhao, W., Ha, Y., Hoo, C.H., Alvarez, A.B.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Intra-cell mixed-Vt; multi-Vt design; standard cell library; subthreshold circuits; yield enhancement
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/84149
• Institution: National University of Singapore

10.1109/ISLPED.2013.6629317