Strain engineering for hole mobility enhancement in P-channel field-effect transistors

International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

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書目詳細資料
主要作者: Yeo, Y.-C.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/84227
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