Strain engineering and junction design for tunnel field-effect transistor

10.1149/1.3487536

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Bibliographic Details
Main Authors: Yeo, Y.-C., Han, G., Yang, Y., Guo, P.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71872
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Institution: National University of Singapore