Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS

10.1002/sia.4881

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Bibliographic Details
Main Authors:	Pan, J., Fang, L.W.-W., Zhang, Z., Yeo, Y.-C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	energy band alignment Ge 2Sb 2Te 5 XPS
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84249
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-84249
record_format	dspace
spelling	sg-nus-scholar.10635-842492023-10-30T22:53:31Z Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS Pan, J. Fang, L.W.-W. Zhang, Z. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING energy band alignment Ge 2Sb 2Te 5 XPS 10.1002/sia.4881 Surface and Interface Analysis 44 8 1013-1017 SIAND 2014-10-07T04:50:31Z 2014-10-07T04:50:31Z 2012-08 Conference Paper Pan, J., Fang, L.W.-W., Zhang, Z., Yeo, Y.-C. (2012-08). Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS. Surface and Interface Analysis 44 (8) : 1013-1017. ScholarBank@NUS Repository. https://doi.org/10.1002/sia.4881 01422421 http://scholarbank.nus.edu.sg/handle/10635/84249 000306662600031 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	energy band alignment Ge 2Sb 2Te 5 XPS
spellingShingle	energy band alignment Ge 2Sb 2Te 5 XPS Pan, J. Fang, L.W.-W. Zhang, Z. Yeo, Y.-C. Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS
description	10.1002/sia.4881
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Pan, J. Fang, L.W.-W. Zhang, Z. Yeo, Y.-C.
format	Conference or Workshop Item
author	Pan, J. Fang, L.W.-W. Zhang, Z. Yeo, Y.-C.
author_sort	Pan, J.
title	Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS
title_short	Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS
title_full	Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS
title_fullStr	Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS
title_full_unstemmed	Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS
title_sort	study of interfaces between phase-change material ge 2sb 2te 5 and prevalent complementary metal-oxide semiconductor materials by xps
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84249
_version_	1781784435923877888

Study of interfaces between phase-change material Ge 2Sb 2Te 5 and prevalent complementary metal-oxide semiconductor materials by XPS

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