Three-port RF characterization of MOS transistors
10.1109/ARFTGS.2005.1500569
محفوظ في:
| المؤلفون الرئيسيون: | , , |
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| مؤلفون آخرون: | |
| التنسيق: | Conference or Workshop Item |
| منشور في: |
2014
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://scholarbank.nus.edu.sg/handle/10635/84307 |
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| المؤسسة: | National University of Singapore |
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sg-nus-scholar.10635-84307 |
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sg-nus-scholar.10635-843072024-11-09T07:32:36Z Three-port RF characterization of MOS transistors Mahalingam, U. Rustagi, S.C. Samudra, G.S. ELECTRICAL & COMPUTER ENGINEERING Admittance matrix Capacitance Impedance Inductance Modeling MOSFETs Scattering parameters measurement 10.1109/ARFTGS.2005.1500569 65th ARFTG Microwave Measurements Conference Digest 2005 57-62 2014-10-07T04:51:10Z 2014-10-07T04:51:10Z 2005 Conference Paper Mahalingam, U.,Rustagi, S.C.,Samudra, G.S. (2005). Three-port RF characterization of MOS transistors. 65th ARFTG Microwave Measurements Conference Digest 2005 : 57-62. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ARFTGS.2005.1500569" target="_blank">https://doi.org/10.1109/ARFTGS.2005.1500569</a> 0780388585 http://scholarbank.nus.edu.sg/handle/10635/84307 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
Admittance matrix Capacitance Impedance Inductance Modeling MOSFETs Scattering parameters measurement |
| spellingShingle |
Admittance matrix Capacitance Impedance Inductance Modeling MOSFETs Scattering parameters measurement Mahalingam, U. Rustagi, S.C. Samudra, G.S. Three-port RF characterization of MOS transistors |
| description |
10.1109/ARFTGS.2005.1500569 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Mahalingam, U. Rustagi, S.C. Samudra, G.S. |
| format |
Conference or Workshop Item |
| author |
Mahalingam, U. Rustagi, S.C. Samudra, G.S. |
| author_sort |
Mahalingam, U. |
| title |
Three-port RF characterization of MOS transistors |
| title_short |
Three-port RF characterization of MOS transistors |
| title_full |
Three-port RF characterization of MOS transistors |
| title_fullStr |
Three-port RF characterization of MOS transistors |
| title_full_unstemmed |
Three-port RF characterization of MOS transistors |
| title_sort |
three-port rf characterization of mos transistors |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/84307 |
| _version_ |
1821228202475913216 |