Dynamic materials testing and modeling of solder interconnects

Proceedings - Electronic Components and Technology Conference

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Bibliographic Details
Main Authors: Ong, K.C., Tan, V.B.C., Lim, C.T., Wong, E.H., Zhang, X.W.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/85929
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Institution: National University of Singapore
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